stemeels tomography (Gatan Inc)
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Gatan Inc
stemeels tomography
Stemeels Tomography, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 95/100, based on 79 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/stemeels+tomography/GIF+Continuum+K3+System/10__1017_slash_S1431927608080574-298-1-21
Average 95 stars, based on 79 article reviews
Stemeels Tomography, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 95/100, based on 79 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/stemeels+tomography/GIF+Continuum+K3+System/10__1017_slash_S1431927608080574-298-1-21
Average 95 stars, based on 79 article reviews
stemeels tomography - by Bioz Stars,
2026-09
95/100 stars
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Tomography:Article Title: Scientific Program Article Snippet: Aspects of Using a Boersch Type Phase Shifting Device for Contrast Enhancement in Macromolecular Electron Microscopy; D Typke, RM Glaeser, KH Downing; Lawrence Berkeley National Laboratory; PC Tiemeijer; FEI, The Netherlands; R Cambie, J Jin; Lawrence Berkeley National Laboratory 11:30 AM 672 Progress on the Development of a Cc/Cs Corrector for TEAM; M Haider, P Hartel, U Loebau; CEOS GmbH, Germany; R Hoeschen; Max-Planck Institute for Metals Research, Germany; H Müller, S Uhlemann, F Kahl, F Zach; CEOS GmbH, Germany 11:45 AM 673 Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope; S Hidetaka, H Fumio, K Toshikazu, T Takeshi, K Yukishito, T Takayuki, O Yoshifumi, T Yasumasa, Y Naoki, T Kunio; CREST Article Title: Scientific Program Article Snippet: Aspects of Using a Boersch Type Phase Shifting Device for Contrast Enhancement in Macromolecular Electron Microscopy; D Typke, RM Glaeser, KH Downing; Lawrence Berkeley National Laboratory; PC Tiemeijer; FEI, The Netherlands; R Cambie, J Jin; Lawrence Berkeley National Laboratory 11:30 AM 672 Progress on the Development of a Cc/Cs Corrector for TEAM; M Haider, P Hartel, U Loebau; CEOS GmbH, Germany; R Hoeschen; Max-Planck Institute for Metals Research, Germany; H Müller, S Uhlemann, F Kahl, F Zach; CEOS GmbH, Germany https://doi.org/10.1017/S1431927608080574 Published online by Cambridge University Press 11:45 AM 673 Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope; S Hidetaka, H Fumio, K Toshikazu, T Takeshi, K Yukishito, T Takayuki, O Yoshifumi, T Yasumasa, Y Naoki, T Kunio; CREST Spectroscopy:Article Title: Scientific Program Article Snippet: Aspects of Using a Boersch Type Phase Shifting Device for Contrast Enhancement in Macromolecular Electron Microscopy; D Typke, RM Glaeser, KH Downing; Lawrence Berkeley National Laboratory; PC Tiemeijer; FEI, The Netherlands; R Cambie, J Jin; Lawrence Berkeley National Laboratory 11:30 AM 672 Progress on the Development of a Cc/Cs Corrector for TEAM; M Haider, P Hartel, U Loebau; CEOS GmbH, Germany; R Hoeschen; Max-Planck Institute for Metals Research, Germany; H Müller, S Uhlemann, F Kahl, F Zach; CEOS GmbH, Germany 11:45 AM 673 Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope; S Hidetaka, H Fumio, K Toshikazu, T Takeshi, K Yukishito, T Takayuki, O Yoshifumi, T Yasumasa, Y Naoki, T Kunio; CREST Article Title: Scientific Program Article Snippet: Aspects of Using a Boersch Type Phase Shifting Device for Contrast Enhancement in Macromolecular Electron Microscopy; D Typke, RM Glaeser, KH Downing; Lawrence Berkeley National Laboratory; PC Tiemeijer; FEI, The Netherlands; R Cambie, J Jin; Lawrence Berkeley National Laboratory 11:30 AM 672 Progress on the Development of a Cc/Cs Corrector for TEAM; M Haider, P Hartel, U Loebau; CEOS GmbH, Germany; R Hoeschen; Max-Planck Institute for Metals Research, Germany; H Müller, S Uhlemann, F Kahl, F Zach; CEOS GmbH, Germany https://doi.org/10.1017/S1431927608080574 Published online by Cambridge University Press 11:45 AM 673 Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope; S Hidetaka, H Fumio, K Toshikazu, T Takeshi, K Yukishito, T Takayuki, O Yoshifumi, T Yasumasa, Y Naoki, T Kunio; CREST |